HFE419X-441 2.5GBPS 850NM VCSEL
NOTES
1. Reliability is a function of temperature, see
www.finisar.com/aoc.php for details.
2. For the purpose of these tests, I
F
is DC current.
3. Threshold current varies as (T
A
– T
O
)
2
. It may either
increase or decrease with temperature, depending upon
relationship of T
A
to T
O
. The magnitude of the change is
proportional to the threshold at T
O
.
4. Slope efficiency is defined as ∆P
O
/∆I
F
.
5. To compute the value of Slope Efficiency at a temperature
T, use the following equation:
η(T) ≈η(25
o
C)*[1+(∆η/∆T)*(T-25)]
6. Rise and fall times specifications are the 20% - 80%. Most
of the devices will measure <135ps fall time. Rise and fall
times are sensitive to drive electronics..
7 To compute the value of Series Resistance at a
temperature T, use the following equation:
R
S
(T) ≈ R
S
(25
o
C)*[1+∆R
S
/∆T)*(T-25)]
8. Monitor current tracking is defined as follows:
TYPICAL PERFORMANCE CURVES
Emitted Power vs. Current: Power varies approximately
linearly with current above threshold.
Threshold Current vs. Temperature: Threshold current varies
parabolically with temperature; thus it can be nearly constant
for a limited temperature range.
[1.1×10
0.45mW / 0.45mW) (PI
0.75mW / 0.75mW) (PI
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